发明名称 IMPROVED SEQUENTIAL SCANNING WAVEFRONT MEASUREMENT AND RETINAL TOPOGRAPHY
摘要 An improved sequential scanning method and apparatus for measuring wavefront aberration involves angularly displacing a measurement beam from a parallel beam striking the corneal surface at a desired location and using the displacement of an image on a detector between the angularly displaced beam and a reference beam to obtain a more accurate wavefront measurement than provided by the displacement between the parallel beam and a reference beam conventionally used for such wavefront aberration measurement. A method and related apparatus for determining a retinal topography relies on using the improved measurement method and apparatus in conjunction with other ocular data to determine changes in the bulbous length of the eye based upon retina l image displacement.
申请公布号 CA2469780(C) 申请公布日期 2008.06.03
申请号 CA20022469780 申请日期 2002.12.13
申请人 TECHNOVISION GMBH GESELLSCHAFT FUR DIE ENTWICKLUNG MEDIZINISCHER TECHNOL OGI 发明人 POLLAND, HANS-JOACHIM
分类号 A61B3/10;A61B3/103;A61B3/12 主分类号 A61B3/10
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