发明名称 |
IMPROVED SEQUENTIAL SCANNING WAVEFRONT MEASUREMENT AND RETINAL TOPOGRAPHY |
摘要 |
An improved sequential scanning method and apparatus for measuring wavefront aberration involves angularly displacing a measurement beam from a parallel beam striking the corneal surface at a desired location and using the displacement of an image on a detector between the angularly displaced beam and a reference beam to obtain a more accurate wavefront measurement than provided by the displacement between the parallel beam and a reference beam conventionally used for such wavefront aberration measurement. A method and related apparatus for determining a retinal topography relies on using the improved measurement method and apparatus in conjunction with other ocular data to determine changes in the bulbous length of the eye based upon retina l image displacement. |
申请公布号 |
CA2469780(C) |
申请公布日期 |
2008.06.03 |
申请号 |
CA20022469780 |
申请日期 |
2002.12.13 |
申请人 |
TECHNOVISION GMBH GESELLSCHAFT FUR DIE ENTWICKLUNG MEDIZINISCHER TECHNOL OGI |
发明人 |
POLLAND, HANS-JOACHIM |
分类号 |
A61B3/10;A61B3/103;A61B3/12 |
主分类号 |
A61B3/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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