| 摘要 |
A system for testing a light emitting diode (LED) ( 20 ) and connectors thereof. The system includes: a chip ( 10 ) having general purpose input output (GPIO) function and a plurality of pins ( 101 ), a test fixture ( 30 ), a parallel interface ( 40 ), and a programmable device ( 50 ). The programmable device includes a setting module ( 501 ), a pin initializing module ( 502 ), a potential controlling module ( 503 ), a data capturing module ( 504 ), and a comparing module ( 505 ). A related method is also provided.
|
