| 摘要 |
A process of data calibration and correction is disclosed that utilizes feedback from a temperature sensor of an x-ray detector to isolate or otherwise select an appropriate calibration or correction map that is specific to the temperature of the x-ray detector during data acquisition. The method is also designed to take into account changes in power transients of an x-ray detector between the acquisition of imaging data and the acquisition of offset data. The method is particularly applicable in optimally selecting and applying gain correction, conversion factor, bad pixel, and offset calibrations.
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