发明名称 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
摘要 A plasma processing apparatus in which consumption of expensive krypton and xenon gases is suppressed as much as possible while reducing damage on a workpiece during plasma processing. In plasma processing of a substrate using a rare gas, two or more kinds of different rare gases are employed, and an inexpensive argon gas is used as one rare gas and any one or both of krypton and xenon gases having a larger collision cross-sectional area against electron than that of the argon gas is used as the other gas. Consequently, consumption of expensive krypton and xenon gases is suppressed as much as possible and damage on a workpiece is reduced during plasma processing.
申请公布号 KR20080048514(A) 申请公布日期 2008.06.02
申请号 KR20087007522 申请日期 2005.09.26
申请人 OHMI TADAHIRO 发明人 OHMI TADAHIRO;TERAMOTO AKINOBU
分类号 H05H1/24;H05H1/00;H05H1/46 主分类号 H05H1/24
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