| 摘要 |
AN AUTOMATIC TEST SYSTEM (100) TRANSFERS MEASURE DATA FROM ONE OR MORE TEST INSTRUMENTS (101A - 101K)TO A PROCESSOR AND PROCESSES THE MEASURE DATA, THE PACKAGING, TRANSFER, AND THE PROCESSING OF THE MEASURE DATA INITIATED BY THE ONE OR MORE TEST INSTRUMENTS (101A 101K). A METHOD (200) FOR TESTING A DEVICE UNDER TEST INCLUDES CAPTURING (204) MEASURE DATA WITH A TEST INSTRUMENT (101A - 101 K), AND INITIATING (208), WITH THE TEST INSTRUMENT (101 A-101K), OPERATION UPON THE MEASURE DATA. THE OPERATIONS INCLUDE PACKAGING (210) THE MEASURE DATA TO PROVIDE PACKAGED DATA, AND TRANSFERRING (212) THE PACKAGED DATA TO A SWITCHING/PROCESSING CIRCUIT FOR PROCESSING (216). A METHOD OF MANUFACTURING AN ELECTRONIC CIRCUIT INCLUDES FABRICATING THE ELECTRONIC CIRCUIT AND TESTING THE ELECTRONIC CIRCUIT WITH THE AFOREMENTIONED METHOD.
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