| 摘要 |
A time measurement circuit and an IC tester employing the same are provided to increase time resolution by using a high speed clock like a system clock, without storing an output of a comparison circuit into a memory with the period of a clock. A plurality of comparison circuits(40) receive a voltage signal, and outputs comparison result by comparing the voltage signal with a reference voltage. A counter(41) receives a clock and counts the clock. A memory(43) stores a count value of the counter. A latch part receives the output of the comparison circuit and the count value of the counter, and preserves the count value of the counter when the output of the comparison circuit is changed, into an address corresponding to the comparison circuit with changed output. |
