MICROCOMPUTER CHIP WITH BUILT-IN NONVOLATILE MEMORY, AND METHOD FOR TESTING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a microcomputer with a built-in nonvolatile memory that can reduce testing cost, by omitting the process of testing a microcomputer part with a logic tester.

SOLUTION: Test data and expected value data from a memory tester 100 are given to and recorded in a nonvolatile memory 141 of the microcomputer 110 with a built-in nonvolatile memory. When an address signal is given to the nonvolatile memory 141, a test signal S141a based on the test data and an expected value signal S141b based on the expected value data are output sequentially; a test signal S142a based on the test signal S141a is transmitted to operate each circuit block of the microcomputer part; a test result signal S135a which is an operation result is obtained; and a test result signal S142b based on the test result signal S135a and the expected value signal S141b are output to the outside via a memory I/F. The memory tester 100 compares the signals output to the outside and decides whether the microcomputer part is operated normally.

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