发明名称 GaN LAYER GROWING METHOD AND SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a GaN layer growing method capable of realizing a GaN growing rate applicable to manufacture of a semiconductor element, and to provide a semiconductor having a GaN layer growing just above an Si substrate. SOLUTION: In the GaN layer growing method using a CVD method to grow a GaN layer just above the Si substrate, the GaN layer is grown in≤100 Torr growing pressure. This invention realizes a GaN layer growing method capable of realizing a GaN layer growing rate applicable to manufacture of a semiconductor element, and provides the semiconductor element having the growing GaN layer just above the Si substrate. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008124264(A) 申请公布日期 2008.05.29
申请号 JP20060306819 申请日期 2006.11.13
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 SATO YOSHIHIRO;KATOU SADAHIRO
分类号 H01L21/205;C23C16/34;H01L21/02;H01L21/336;H01L21/441;H01L29/12;H01L29/47;H01L29/78;H01L29/872 主分类号 H01L21/205
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