发明名称 |
GaN LAYER GROWING METHOD AND SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a GaN layer growing method capable of realizing a GaN growing rate applicable to manufacture of a semiconductor element, and to provide a semiconductor having a GaN layer growing just above an Si substrate. SOLUTION: In the GaN layer growing method using a CVD method to grow a GaN layer just above the Si substrate, the GaN layer is grown in≤100 Torr growing pressure. This invention realizes a GaN layer growing method capable of realizing a GaN layer growing rate applicable to manufacture of a semiconductor element, and provides the semiconductor element having the growing GaN layer just above the Si substrate. COPYRIGHT: (C)2008,JPO&INPIT
|
申请公布号 |
JP2008124264(A) |
申请公布日期 |
2008.05.29 |
申请号 |
JP20060306819 |
申请日期 |
2006.11.13 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
SATO YOSHIHIRO;KATOU SADAHIRO |
分类号 |
H01L21/205;C23C16/34;H01L21/02;H01L21/336;H01L21/441;H01L29/12;H01L29/47;H01L29/78;H01L29/872 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|