| 摘要 |
A probe installed to a probe card is provided. A tip or a body of the probe are electroplated with a conductive film and the probe card is placed in a vacuum electroplating furnace. Or, the body of the probe is electroplated with an insulating film and the probe card is placed in a vacuum electroplating furnace. Further, a probe with worn conductive film is electroplated again with a conductive film. The conductivity of the probe is increased and the probe is more worn-endurable and friction endurable. The dirt and dregs on the surface of the probe can be reduced. Electromagnetic interference is decreased and the probe can be trimmed easily. The probe is reused again and again and the lifetime of the probe is prolonged. The yield ratio is increased and the cost in testing is reduced.
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