TEST DEVICE AND TEST MODULE

摘要

Provided is a test device for testing a device under test (DUT). The test device includes: a signal supply unit which supplies a test signal to a DUT; an input unit which inputs an output signal outputted from the DUT in accordance with the test signal as a signal to be measured; a cyclic pulse generation unit which generates a cyclic pulse having a pulse width corresponding to one cycle of the signal to be measured according to a sample clock specifying the timing to sample the signal to be measured; a conversion unit which outputs a voltage corresponding to the width of the cyclic pulse; an AD converter which converts a voltage into a digital voltage value; a pulse width calculation unit which calculates a digital pulse width indicating a pulse width of the cyclic pulse from the digital voltage value; and an adjusting unit which adjusts a conversion parameter used to perform conversion from the digital voltage value to a digital pulse width.