| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an interface test circuit and a method including a high-speed input/output circuit (HSIO) test circuit and method which can be used for assembled self-test (BIST). <P>SOLUTION: In one embodiment, a device comprises a conductor, and a transmitter including a transmitter test circuit which embeds test characteristics in a test pattern signal and transmits the test pattern signal to the conductor. Also in one embodiment, the device comprises the conductor which conveys the test pattern which has the embedded test characteristics, and a receiver test circuit which judges whether the test pattern signal is received, and test characteristics are extracted, and extracted test characteristics adapt a predetermined test characteristics. Other embodiments are indicated by the specifications and claims. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
