发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE, ELECTROOPTIC DEVICE, AND ELECTRONIC EQUIPMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method for a semiconductor substrate inhibiting the deterioration of the electrical characteristics of a semiconductor layer resulting from a substrate floating effect and displaying excellent electrical characteristics, to provide a semiconductor substrate, to provide a semiconductor device, to provide an electrooptic device, and to provide electronic equipment. <P>SOLUTION: A non-single-crystal semiconductor layer 210 is formed on one surface side of a single-crystal semiconductor substrate 200, and an insulating layer 211 is formed on the top face of the non-single-crystal semiconductor layer 210. Ions are implanted into the single-crystal semiconductor substrate 200 from the insulating layer 211 side to form an ion implanting layer 205. After the ions are implanted, a supporting substrate 500 is laminated on the insulating layer 211 side of the single-crystal semiconductor substrate 200. A surface layer section reverse to the non-single-crystal semiconductor layer 210 in the single-crystal semiconductor substrate 200 is separated by the ion implanting layer 205, and a single-crystal semiconductor layer 220 is formed on the supporting substrate 500. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008124104(A) 申请公布日期 2008.05.29
申请号 JP20060303650 申请日期 2006.11.09
申请人 SEIKO EPSON CORP 发明人 JIROKU HIROAKI
分类号 H01L21/02;G02F1/136;G02F1/1368;H01L21/20;H01L21/336;H01L27/12;H01L29/786 主分类号 H01L21/02
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