发明名称 |
A Current Mirror with Circuitry That Allows for Over Voltage Stress Testing |
摘要 |
A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transistor; a bias source coupled to a control node of the switch such that the switch is ON during normal current mirror operation, and the switch is OFF during over voltage stress testing; and a clamp coupled between the control node of the switch and a source node.
|
申请公布号 |
US2008122475(A1) |
申请公布日期 |
2008.05.29 |
申请号 |
US20060422144 |
申请日期 |
2006.06.05 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
ATRASH AMER HANI;ADAMS REED WILBURN |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|