发明名称 METHOD FOR SETTING UP BIT ERROR RATE CRITERION AND METHOD FOR BURN-IN TEST OF HARD DISK DRIVE
摘要 A method for setting up a BER(Bit Error Rate) criterion of a hard disk drive and a burn-in test method using the same are provided to minimize errors in determination of a qualified hard disk drive by modifying BER criterion in accordance with temperature variation of the hard disk drive. A burn-in test method comprises the steps of: measuring temperature of a hard disk drive(S10); modifying a BER criterion by setting a new BER criterion greater than a BER criterion at an optimum temperature for burn-in test if the measured temperature of the hard disk drive is greater than the optimum temperature for burn-in test, while setting a new BER criterion smaller than the BER criterion at the optimum temperature for burn-in test if the measured temperature of the hard disk drive is smaller than the optimum temperature for burn-in test(S20); calculating the BER of the hard disk drive(S30); and determining the hard disk drive as disqualified if the calculated BER of the hard disk drive is smaller than the new BER criterion, while determining the hard disk drive as qualified if the calculated BER is equal to or greater than the new BER criterion(S40).
申请公布号 KR100833198(B1) 申请公布日期 2008.05.28
申请号 KR20070023676 申请日期 2007.03.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG HYUB;LEE, HAE JUNG
分类号 G11B20/18 主分类号 G11B20/18
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