发明名称 System and method for performing hard glass inspection
摘要 A system and method to inspect objects for a characteristic parameter. The system includes at least one electromagnetic source for emitting at least two separate wavelengths of electromagnetic energy. At least one electromagnetic detector is positioned at a predefined distance from the electromagnetic source to measure an incident intensity value of the electromagnetic energy at the two wavelengths. An object, placed between the electromagnetic source and the electromagnetic detector is irradiated with electromagnetic energy at the two wavelengths and the electromagnetic energy transmitted through the object is measured by the electromagnetic detector. The system includes a computer-based platform operationally connected to the electromagnetic detector for receiving intensity data values from the electromagnetic detector and for computing attenuation ratio values. The attenuation ratio values are used to determine a level of the characteristic parameter.
申请公布号 US7379177(B1) 申请公布日期 2008.05.27
申请号 US20060382300 申请日期 2006.05.09
申请人 APPLIED VISION COMPANY, LLC 发明人 SONES RICHARD A.;NOVINI AMIR
分类号 G01N21/00 主分类号 G01N21/00
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