发明名称 Method of fabricating semiconductor device
摘要 After low dielectric constant films are formed on a wiring, hardmasks are formed on the low dielectric constant films. A resistmask is formed on the hardmasks. Via holes are formed in the low dielectric constant films using the resistmask. Ashing the resistmask is performed. During this process, a protection film is formed by sticking a sputtered material generated from the resistmask at least onto side surfaces of the via holes. Thereafter, the via holes are extended to the wiring, and a conductive material is buried into the via holes.
申请公布号 US7378352(B2) 申请公布日期 2008.05.27
申请号 US20060411043 申请日期 2006.04.26
申请人 FUJITSU LIMITED 发明人 IBA YOSHIHISA
分类号 H01L21/302 主分类号 H01L21/302
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