发明名称 Test circuit and method for hierarchical core
摘要 A wrapper architecture has a parent core A and a child core B. The parent core A comprises scan chains ( 70 ), wrapper input cells ( 71 ), wrapper output cells ( 74 ) and a parent TAM, PTAM [ 0:2 ]. Likewise, the child core comprises scan chains ( 76 ), wrapper input cells ( 75 ) and wrapper output cells ( 72 ), and is connected to a child TAM, CTAM [ 0:2 ]. Each wrapper input cell ( 75 ) and each wrapper output cell ( 72 ) of the child core is adapted to be connected to the parent TAM, PTAM, in addition to being connected to the child TAM, CTAM, thereby enabling the child core to be placed in the In-test and Ex-test modes at the same time, and allowing the parent and child cores to be tested in parallel.
申请公布号 US7380181(B2) 申请公布日期 2008.05.27
申请号 US20050591191 申请日期 2005.02.22
申请人 NXP B.V. 发明人 GOEL SANDEEP K.
分类号 G01R31/28;G01R31/3185 主分类号 G01R31/28
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