发明名称 |
ELECTRODE FOR PLACING WAFER |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a highly reliable electrode for placing a wafer capable of preventing the dielectric breakdown of a heat transfer gas. <P>SOLUTION: The electrode for placing a wafer is provided with an electrode body 1 having a flow passage for circulating a temperature-adjusting medium therein, a dielectric film 2 formed on the wafer mounting surface of the electrode body; and an insulative gas introducing passage 10 for supplying a heat transfer gas into a gap formed by the dielectric film and a specimen placed on the dielectric film through the inside of the electrode body. The electrode is used for placing the wafer 3 placed on the dielectric film in a vacuum chamber to apply plasma treatment to the wafer using plasma generated in the vacuum chamber. Ridges each having a concave portion substantially perpendicular to the axis of the introducing passage are formed in the a portion of the gas introducing passage which faces the wafer placing surface. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
申请公布号 |
JP2008117849(A) |
申请公布日期 |
2008.05.22 |
申请号 |
JP20060297794 |
申请日期 |
2006.11.01 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
SHIRAYONE SHIGERU;TAKATSUMA YUTAKA;TSUBONE TSUNEHIKO;ARAMAKI TORU |
分类号 |
H01L21/3065;C23C16/458;H01L21/205;H01L21/683 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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