发明名称 METHOD FOR MANUFACTURING PHASE GRATING MASK AND METHOD FOR MANUFACTURING PHOTOMASK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a photomask enabling a more accurate tone representation. <P>SOLUTION: The photomask has a transparent substrate (42) and a phase grating structured from a plurality of grooves of a fixed pitch (P) formed on the substrate, wherein either the depth or width of the respective grooves of the phase grating is made to bear the exposure pattern. When the wavelength of the exposure light of an exposure apparatus irradiating the photomask is set toλand the incident side numerical aperture of the imaging system lens is set to NAi, these factors satisfy P<λ/NAi. Thereby, the grating will no longer be imaged, and the exposure pattern represented with the depth or width of the respective grooves of the phase grating will be transcribed onto a photosensitive material. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008116976(A) 申请公布日期 2008.05.22
申请号 JP20070312763 申请日期 2007.12.03
申请人 SEIKO EPSON CORP 发明人 MIYAMAE AKIRA;NAGASAKA KIMIO
分类号 G02B5/18;G02B5/32;G03F1/28;G03F1/68;G03F1/76;G03F1/80;G03H1/08 主分类号 G02B5/18
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