发明名称 Method of Manufacturing Thin Film, Method of Manufacturing P-Type Zinc Oxide Thin Film and Semiconductor Device
摘要 There is provided a method of manufacturing a thin film, in which not only high crystallinity and surface flatness can be realized but also dopant doping can be performed at high concentration. The method includes a low temperature highly doped layer growing step of performing dopant doping while growing the thin film at a given first temperature; an annealing step of interrupting the growth of the thin film and annealing the thin film at a given second temperature higher than the first temperature; and a high temperature lowly doped layer growing step of growing the thin film at the second temperature.
申请公布号 US2008118769(A1) 申请公布日期 2008.05.22
申请号 US20040588283 申请日期 2004.09.10
申请人 TOHOKU UNIVERSITY 发明人 KAWASAKI MASASHI;OHTOMO AKIRA;FUKUMURA TOMOAKI;TSUKAZAKI ATSUSHI;OHTANI MAKOTO
分类号 H01L29/12;B29C71/00;C30B29/16;H01L21/205;H01L21/363;H01L33/28;H05B6/00 主分类号 H01L29/12
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