发明名称 METHOD FOR REPAIRING DEFECTS IN MEMORY AND RELATED MEMORY SYSTEM
摘要 A method for repairing defects in a memory is disclosed. The method includes: performing a defect test on the memory to obtain at least one defect address of the memory, storing the at least one defect address into a storage media, storing the at least one defect address stored in the storage media into a storage module of the memory, determining whether a target address matches any of the at least one defect address after an access request pointing to the target address of the memory is received, and accessing a redundant cell of a memory cell directed by the target address in response to the access request.
申请公布号 US2008117696(A1) 申请公布日期 2008.05.22
申请号 US20070751046 申请日期 2007.05.21
申请人 CHANG CHUAN-JEN;CHOU YEN-PING;LIU WEI-LI 发明人 CHANG CHUAN-JEN;CHOU YEN-PING;LIU WEI-LI
分类号 G11C29/00 主分类号 G11C29/00
代理机构 代理人
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