发明名称 EVALUATION INDEX CALCULATION DEVICE, EVALUATION DEVICE, EVALUATION INDEX CALCULATION METHOD, CONTROL PROGRAM OF EVALUATION INDEX CALCULATION DEVICE AND RECORDING MEDIUM WITH PROGRAM RECORDED THEREON
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an evaluation index calculation device or the like capable of more precisely evaluating the state of a solder material than a conventional technique. <P>SOLUTION: A solder material evaluation device 100 is constituted so as to evaluate the deterioration degree of the solder material 13 by utilizing the solder material 13. In the solder material evaluation device 100, the solder material 13 is irradiated with the light from a light source 10, and the intensity of a target wave number, which is the wave number of the intensity of the infrared rays reflected from the solder material 13 and related to the state change of the solder material 13, and the intensity of a reference wave number being the wave number not related to the state change are detected by a photoelectric converter 14. A control part 15 corrects the absorbance of the target wave number calculated from the intensity of the target wave number detected by the photoelectric converter 14 using the absorbance of the reference wave number calculated from the intensity of the reference wave number detected by the photoelectric converter 14 to display the corrected absorbance of the target wave number on a display part. By this arrangement, the operator of the solder material evaluation device 100 refers to the corrected absorbance of the target wave number to evaluate the deterioration degree of the solder material 13. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008116365(A) 申请公布日期 2008.05.22
申请号 JP20060300811 申请日期 2006.11.06
申请人 OMRON CORP 发明人 HORINO MASANOBU;OHASHI KATSUMI
分类号 G01N17/00;G01N21/35;G01N21/3563;G01N21/359 主分类号 G01N17/00
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