发明名称 PRINTED MATTER INSPECTION DEVICE AND PRINTED MATTER INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To apply high-definition inspection accuracy setting to a plurality of determination areas divided arbitrarily in a pixel unit, such as to determine respective optional determination conditions. <P>SOLUTION: This printed matter inspection device previously stores a threshold image that is a determination reference image of a printed matter; a determination area image obtained by painting out a plurality of determination areas for making determination conditions, differing with pixels having respectively different density values, and a determination condition table for associating the density values of the determination area image with the determination conditions; inputs an image of the printed matter, compares inspection image, obtained by performing predetermined preprocessing of the input image with the threshold image; extracts defective candidates on the inspection image; extracts the center position of a defective candidate on the inspection image; specifies a pixel on a determination area image corresponding to the center position of the defective candidate; refers to a determination condition associated with a density value on the determination condition table with reference to the density value; and determines the defect of the defective candidate, on the basis of the determination conditions. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008118445(A) 申请公布日期 2008.05.22
申请号 JP20060300405 申请日期 2006.11.06
申请人 NEC CORP 发明人 OKAMURA ATSUHIRO
分类号 H04N1/00;B41F33/14;G01N21/88;G06T1/00;G07D7/20 主分类号 H04N1/00
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