发明名称 |
LITHOGRAPHIC APPARATUS AND METHOD OF MANUFACTURING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To prevent local variation and deformation of refractive indexes of optical elements owing to uneven heating of them by a radiation beam resulting in prevention of deformation of air images projected on a resist layer. <P>SOLUTION: A lithographic equipment including an optical arrangement with an array of optical elements arranged in a plane perpendicular to the radiation beam is disclosed. Each optical element comprises an electrical heating device to change an optical path length of the radiation beam. By selectively operating the heating devices, a position dependent change in optical path length can be achieved in order to correct irradiation-induced optical path length errors. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008118135(A) |
申请公布日期 |
2008.05.22 |
申请号 |
JP20070282718 |
申请日期 |
2007.10.31 |
申请人 |
ASML NETHERLANDS BV;CARL ZEISS SMT AG |
发明人 |
JANSEN BASTIAAN STEPHANUS HENDRICUS;LOOPSTRA ERIK ROELOF;RAVENSBERGEN MARIUS;HAUF MARKUS JOSEF |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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