发明名称 LITHOGRAPHIC APPARATUS AND METHOD OF MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To prevent local variation and deformation of refractive indexes of optical elements owing to uneven heating of them by a radiation beam resulting in prevention of deformation of air images projected on a resist layer. <P>SOLUTION: A lithographic equipment including an optical arrangement with an array of optical elements arranged in a plane perpendicular to the radiation beam is disclosed. Each optical element comprises an electrical heating device to change an optical path length of the radiation beam. By selectively operating the heating devices, a position dependent change in optical path length can be achieved in order to correct irradiation-induced optical path length errors. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008118135(A) 申请公布日期 2008.05.22
申请号 JP20070282718 申请日期 2007.10.31
申请人 ASML NETHERLANDS BV;CARL ZEISS SMT AG 发明人 JANSEN BASTIAAN STEPHANUS HENDRICUS;LOOPSTRA ERIK ROELOF;RAVENSBERGEN MARIUS;HAUF MARKUS JOSEF
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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