| 摘要 |
PROBLEM TO BE SOLVED: To distinctly determine generation methods of various signals to be supplied from a semiconductor device to a digital video data test device in a digital video data test system. SOLUTION: The digital video data test system includes a semiconductor device 4 to be tested and a digital video data test device 1. In the semiconductor device 4, a clock frequency division section 30 divides a frequency of a digital video clock 31 to generate a frequency-divided clock 32. A timing signal generation section 40 generates a timing signal 42 synchronizing with the frequency-divided clock 32 using a synchronizing signal 41 in digital video data 2. A code holding section 50 outputs a generated code generated by a code generation section 11, to the digital video data test device 1 in synchronization with the timing signal 42 and the frequency-divided clock 32. COPYRIGHT: (C)2008,JPO&INPIT
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