| 摘要 |
An insert for a semiconductor device test handling apparatus, a tray, and the semiconductor device handling apparatus are provided to reduce a test cost of the semiconductor device by separating a pocket of the insert from a main body of the insert and replacing the pocket according to the number of input/output pins and a size of the semiconductor. An insert for a semiconductor device test handling apparatus includes a pocket(108), a main body(100), a cover(104), a latch(102), and a hook(106). The pocket includes a loading portion therein. A semiconductor device is mounted on the loading portion. The main body is arranged on the pocket and includes a loader at a center portion therein. The semiconductor device is loaded on the loader. The cover is formed on the main body and covers the insert. The latch couples the cover with the main body. The hook couples the pocket or a DUT(Device Under Test) with the main body. The DUT is mounted on the pocket and tested. |
