发明名称 Highly reliable NAND flash memory using five side enclosed floating gate storage elements
摘要 A NAND flash memory system with an array of individual charge storage elements, such as floating gates, arranged in a NAND string, each element being capable of selectively storing data in the form of charge there-in during a program or an erase operation, and during a read operation sensing the quantum of charge stored to provide reconstruction of data. Such a memory made with a floating gate that is spaced away from the diffusions and covered on all five sides except the channel side, by the control gate, there by having increased coupling with the associated advantage of lower high voltages, reduced impact of the unwanted disturb conditions, and providing for improved retention and reliability characteristics at higher operating temperatures is disclosed. The main emphasis in this technology is to provide a device with improved retention, endurance, and temperature characteristics meeting the Automotive specifications even with some area penalty.
申请公布号 US7376014(B2) 申请公布日期 2008.05.20
申请号 US20060506026 申请日期 2006.08.18
申请人 THOMAS MAMMEN 发明人 THOMAS MAMMEN
分类号 G11C11/34 主分类号 G11C11/34
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