发明名称 Reduced state estimation with biased and out-of-sequence measurements from multiple sensors
摘要 This invention relates to state estimation after processing time-delayed measurements with unknown biases that may vary arbitrarily in time within known physical bounds. These biased measurements are obtained from systems characterized by state variables and by multidimensional parameters, for which the latter are also unknown and may vary arbitrarily in time within known physical bounds. If a measurement is time-late, apply the measurements to an out-of-sequence filter using a mean square optimization criterion that accounts for all sources of uncertainty and delay time, to produce estimates of the true states of the system. If the measurement is not time-late, apply the measurements to an in-sequence filter using a mean square optimization criterion that accounts for all sources of uncertainty to produce estimates of the true states of the system. The estimates are applied to one of (a) making a decision, (b) operating a control system, and (c) controlling a process.
申请公布号 US7375679(B1) 申请公布日期 2008.05.20
申请号 US20050204630 申请日期 2005.08.16
申请人 LOCKHEED MARTIN CORPORATION 发明人 MOOKERJEE PURUSOTTAM;REIFLER FRANK J.
分类号 G01S7/285 主分类号 G01S7/285
代理机构 代理人
主权项
地址
您可能感兴趣的专利