发明名称 Method of manufacturing a semiconductor device
摘要 To provide a penetration electrode having high quality. A method of manufacturing a semiconductor device includes the following steps: (a) forming a concave part from a first face of a semiconductor substrate in which an integrated circuit is formed; (b) providing a resin layer at least on the bottom face of the concave part; (c) forming a conductive part to an inner side of the resin layer of the concave part; (d) disposing the resin layer from a second face opposite to the first face of the semiconductor substrate by wet etching; and (e) exposing the conductive part from the second face of the semiconductor substrate.
申请公布号 US7375007(B2) 申请公布日期 2008.05.20
申请号 US20050030165 申请日期 2005.01.07
申请人 SEIKO EPSON CORPORATION 发明人 FUKAZAWA MOTOHIKO
分类号 H01L21/30;H01L23/52;H01L21/3205;H01L21/44;H01L21/768;H01L23/31;H01L23/48;H01L23/522;H01L25/065;H01L25/07;H01L25/18;H01L29/22 主分类号 H01L21/30
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