| 摘要 |
A multichip and a test method thereof are provided to perform various test patterns according to information stored in an ID register by installing the ID register to each memory, checking the memory with the information stored in the ID register, and generating the test pattern suitable for the checked memory. A plurality of memories(140,160,180) store memory information and a control chip(120) test the memories, and the control chip includes a register(124) storing a test pattern and a CPU(122) such as an ARM(Advanced RISC(Reduced Instruction Set Computer) Machines) core. The CPU checks the memory to be tested by reading the memory information from each memory, generates and transfers the test pattern suitable for the checked memory to the register, and tests the memory by using the test pattern stored in the register. Each memory includes an ID register(142,162,182) storing the memory information such as a memory type, size, and I/O(Input/Output) pattern. The control chip includes a chip select circuit for electrically connecting each memory to the CPU based on a chip select signal generated from the CPU.
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