发明名称 |
TEST DE MEMORIA. |
摘要 |
The invention relates to a method and device for operating and/or testing memory units, which make it possible to conduct a time-saving test of semiconductor memories during running operation. The inventive method for testing memory units having storage locations provides that, for the storage locations, a first item of test information is formed according to a variable parameter assigned to the respective storage location and according to the contents of the respective storage location.
|
申请公布号 |
ES2298404(T3) |
申请公布日期 |
2008.05.16 |
申请号 |
ES20020779192T |
申请日期 |
2002.10.30 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
MERCHANT, KAMAL;MAYER, FRANK |
分类号 |
G11C29/00;G06F11/10;G06F11/22 |
主分类号 |
G11C29/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|