| 摘要 |
A multichip and method of testing a multichip, the multichip including a control chip having a central processing unit (CPU) and a plurality of memories, each memory of the plurality of memories storing information related to testing the multichip, comprises connecting one of the memories to the control chip; reading, by the CPU, stored memory information from the connected one of the memories to confirm the connected one of the memories; generating a test pattern relating to the connected one of the memories confirmed by the CPU, and testing the connected one of the memories according to the test pattern.
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