发明名称 METHOD OF FORMING HIGH DIELECTRIC FILM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a high dielectric film in which a hydrogen-containing component hardly remains in the film even in a low-temperature film deposition condition using an organic metal material. SOLUTION: The method has a step of forming a high dielectric film using an organic metal material on a substrate 1 at≤350°C using an ALD or CVD method, and a step of irradiating the high dielectric film with an ultraviolet ray in a low-pressure oxygen-containing atmosphere to desorb the hydrogen in the film. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008112762(A) 申请公布日期 2008.05.15
申请号 JP20060293304 申请日期 2006.10.27
申请人 TOKYO ELECTRON LTD 发明人 UCHIDA HIROAKI;TAKAHASHI TAKESHI
分类号 H01L21/316;C23C16/40;H01L29/78 主分类号 H01L21/316
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