发明名称 |
METHOD OF FORMING HIGH DIELECTRIC FILM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming a high dielectric film in which a hydrogen-containing component hardly remains in the film even in a low-temperature film deposition condition using an organic metal material. SOLUTION: The method has a step of forming a high dielectric film using an organic metal material on a substrate 1 at≤350°C using an ALD or CVD method, and a step of irradiating the high dielectric film with an ultraviolet ray in a low-pressure oxygen-containing atmosphere to desorb the hydrogen in the film. COPYRIGHT: (C)2008,JPO&INPIT
|
申请公布号 |
JP2008112762(A) |
申请公布日期 |
2008.05.15 |
申请号 |
JP20060293304 |
申请日期 |
2006.10.27 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
UCHIDA HIROAKI;TAKAHASHI TAKESHI |
分类号 |
H01L21/316;C23C16/40;H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|