发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A semiconductor substrate is covered with a resist mask and then an opening for exposing a whole upper surface of a polysilicon gate is formed by photo lithography and dry etching. Thereafter, nitrogen ions are implanted into the polysilicon gate through the opening. Implantation energy at this time is set so that the implanted ions may not break through the polysilicon gate.
申请公布号 US2008113480(A1) 申请公布日期 2008.05.15
申请号 US20070939941 申请日期 2007.11.14
申请人 RENESAS TECHNOLOGY CORP. 发明人 NISHIDA YUKIO;HAYASHI TAKASHI;YAMASHITA TOMOHIRO;HORITA KATSUYUKI;EIKYU KATSUMI
分类号 H01L21/8236 主分类号 H01L21/8236
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