发明名称 DEVICE AND METHOD FOR MEASURING A GAP BETWEEN MEMBERS OF A STRUCTURE FOR MANUFACTURE OF A SHIM
摘要 An apparatus for measuring a gap between a first mating surface of a first component and a second mating surface of a second component has a substrate. A plurality of capacitive sensors is coupled to the substrate. A controller is coupled to the plurality of capacitive sensors. The controller is used to select each individual capacitive sensor to measure the gap between the first mating surface of the first component and the second mating surface of the second component.
申请公布号 US2008110275(A1) 申请公布日期 2008.05.15
申请号 US20060555315 申请日期 2006.11.01
申请人 ODENDAHL DAVID J 发明人 ODENDAHL DAVID J.
分类号 G01B7/16 主分类号 G01B7/16
代理机构 代理人
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