| 摘要 |
PROBLEM TO BE SOLVED: To shorten the time for power supply noise analysis and increase the work efficiency. SOLUTION: Power supply wiring dimension data, transistor performance data and substrate dimension data in a semiconductor integrated circuit are extracted from divided layout data in each region of the semiconductor integrated circuit generated from layout data on the semiconductor integrated circuit. A power supply wiring model, a transistor model and a substrate model are generated as components of a power supply noise analysis model from the various data thus extracted, and the power supply noise analysis model is created from the various models thus generated. COPYRIGHT: (C)2008,JPO&INPIT
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