发明名称 Plesiochronous transmit pin with synchronous mode for testing on ATE
摘要 A method and apparatus for conveying test response data from an integrated circuit to ATE via a plesiochronous interconnect. The integrated circuit includes a core logic unit and a first transmitter coupled thereto by a first data path. In a normal mode, data conveyed from the core logic unit to the transmitter may be transmitted plesiochronously over an interconnect coupled to the transmitter output. The integrated circuit further includes a second data path coupled between the core logic unit and the interconnect. During a test mode, test response data may be conveyed from the core logic unit to ATE via the second data path and the interconnect, wherein the test response data is synchronously transmitted over the interconnect.
申请公布号 US2008115021(A1) 申请公布日期 2008.05.15
申请号 US20060582803 申请日期 2006.10.18
申请人 SUN MICROSYSTEMS, INC. 发明人 PARULKAR ISHWARDUTT
分类号 G01R31/28 主分类号 G01R31/28
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