发明名称 Charged particle beam irradiation apparatus
摘要 To ensure irradiation accuracy and safety, even when an irradiation device employing a different irradiation method is used, disclosed is herein a charged particle beam irradiation apparatus that irradiates an irradiation target with charged particle beams includes: a charged particle beam generator for generating the charged particle beams; a passive scattering irradiation device and a scanning irradiation device, both for irradiating the irradiation target with the charged particle beams; a beam transport system for transporting the charged particles beam extracted from the charged particle beam generator, to selected one of the two irradiation devices; and a central controller that modifies operating parameters on the charged particle beam generator, according to the irradiation method adopted for the selected irradiation device.
申请公布号 EP1642617(B1) 申请公布日期 2008.05.14
申请号 EP20050021071 申请日期 2005.09.27
申请人 HITACHI, LTD. 发明人 MATSUDA, KOJI;HIRAMOTO, KAZUO;MORIYAMA, KUNIO
分类号 A61N5/10 主分类号 A61N5/10
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