| 摘要 |
A test circuit is provided to perform chip test at a high speed mode by outputting a test result value to a dedicated output port and maintaining the output value in a storing part for a fixed time. A test circuit receives a test vector and verifies the operation of an electronic device with the test vector value. The test circuit includes a data input/output part(110), a test output part(130), a calculation part(120) and a control part(140). The calculation part calculates a test result value according to a fixed logic operation. A control part controls the calculation part to perform the test when the test vector is inputted through the data input/output part in a high speed test mode and to output the calculated test result value to the data output part. The data output part further includes a storing part. The control part controls the calculation part to store the test result value in the storing part.
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