SUBSTRATE, SEMICONDUCTOR DEVICE USING THE SAME, METHOD FOR INSPECTING SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

摘要

A substrate, a semiconductor device using the same, a method for inspecting the semiconductor device, and a method for manufacturing the semiconductor device are provided to reduce a mounting area, signal wiring capacity, and noise by improving a structure thereof. A substrate including at least one semiconductor stacked circuit is formed in a substrate stacked through an insulating layer. The substrate includes a first electrode terminal(13) connected to the semiconductor stacked circuit, a second electrode terminal(14) connected to a terminal of an upper substrate arranged on an upper layer of the substrate, and a third electrode terminal(15) positioned at an outside of an extension of the upper substrate in a part of outer circumferences of the first and second electrode terminals.