APPARATUS FOR TESTING A IMAGE SENSOR

摘要

An apparatus for testing an image sensor is provided to selectively test the required number of chips and to improve test reliability by controlling a region of light incident into the image sensor according to the number of the chips for testing. A light source(110) irradiates light to an image sensor(170). A diffusion filter(140) is arranged between the light source and the image sensor. The diffusion filter controls an angle of the light incident into the image sensor. A probe card(120) has a probe(130) contacted to a pad of the image sensor. The probe card tests photoelectric transformation characteristic of the image sensor according to the light. A support(150) supports a side of the diffusion filter. The support fixes the diffusion filter to the probe card. A fly-eye lens array(160) is formed between the light source and the diffusion filter. The fly-eye lens array makes intensity of the light irradiated from the light source uniform.