发明名称 METOD OF FABRICATING THIN FILM TRANSISTOR SUBSTRATE
摘要 <p>A method for fabricating a TFT substrate is provided to improve an aperture ratio and reduce the size of a TFT substrate by improving the layer quality of a first active layer so that the charge mobility of a channel region is increased. A gate interconnection and a gate insulation layer(30) are sequentially formed on an insulation substrate(10). A first hydrogen plasma process is performed on the gate insulation layer. A first active layer(41) of a first thickness is formed on the gate insulation layer at a first deposition rate. A second hydrogen plasma process is performed on the first active layer wherein the power per unit area applied to a chamber can be 0.04-0.06 W/centimeter^2. A second active layer of a second thickness greater than the first thickness is formed on the first active layer at a second deposition rate higher than the first deposition rate.</p>
申请公布号 KR20080041426(A) 申请公布日期 2008.05.13
申请号 KR20060109514 申请日期 2006.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH, HWA YEUL;KIM, BYOUNG JUNE;YANG, SUNG HOON;CHOI, JAE HO;CHOI, YONG MO;GIROTRA KUNAL
分类号 H01L29/786 主分类号 H01L29/786
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