Socket-less test board and clamp for electrical testing of integrated circuits

摘要

A socket-less test board and a clamp for clamping an integrated circuit to the socket-less test board is disclosed. The test board includes a recess region for receiving an integrated circuit to be tested. The clamp includes a base structure with a recess region to accommodate the integrated circuit and a heat sink that is positioned in contact with the package of the integrated circuit. Mounting and fastening elements mount and fasten the clamp to the test board, holding the integrated circuit in place during electrical testing.