发明名称 TEST SYSTEM IMPROVED SIGNAL INTEGRITY AS RESTRAINING REFLECTING WAVE
摘要 A test system with improved signal integrity as restraining a reflecting wave is provided to improve signal integrity at an operation frequency of a high speed memory using a divided transmission line. A test system includes a test unit(220) and a test board(210). The test board is connected to the test unit, and is loaded with a plurality of memories connected in parallel through a transmission path. The test board includes a compensation unit to compensate signal distortion on the transmission line. The compensation device is an inverter connected to the transmission line.
申请公布号 KR20080041405(A) 申请公布日期 2008.05.13
申请号 KR20060109460 申请日期 2006.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG, KI JAE
分类号 G11C29/00 主分类号 G11C29/00
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