发明名称 Nonvolatile semiconductor memory device
摘要 A memory cell and a selection transistor for selecting the memory cell are provided. The memory cell includes a floating gate formed on a semiconductor substrate via a first gate insulation film, a pair of first diffusion layers positioned on the opposite sides of the floating gate and formed in the substrate, first and second control gates formed on the opposite sides of the floating gate to drive the floating gate, and an inter-gate insulation film formed between the first and second control gates and the floating gate. The selection transistor includes a selection gate wiring including a first portion constituted of the same conductive layer as the first conductive layer, and a second portion constituted of the same conductive layer as the second conductive layer, and a second diffusion layer formed in the substrate, facing the second portion of the selection gate wiring.
申请公布号 US7371643(B2) 申请公布日期 2008.05.13
申请号 US20070672834 申请日期 2007.02.08
申请人 发明人
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址