发明名称 |
Vertical gate semiconductor device and method for fabricating the same |
摘要 |
A source region is formed by performing ion implantation plural times to diffuse an impurity from the upper surface of a semiconductor region toward a region far dawn therefrom and to increase impurity concentration in the vicinity of the upper surface of the semiconductor region, whereby the source region and a gate electrode are overlapped with each other surely. Thus, offset between the gate and the source is prevented and an excellent ohmic contact is formed between a source electrode and the source region.
|
申请公布号 |
US7372088(B2) |
申请公布日期 |
2008.05.13 |
申请号 |
US20040016713 |
申请日期 |
2004.12.21 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
MIYATA SATOE;MIZOKUCHI SHUJI |
分类号 |
H01L29/76;H01L21/336;H01L29/06;H01L29/08;H01L29/423;H01L29/45;H01L29/78 |
主分类号 |
H01L29/76 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|