发明名称 Vertical gate semiconductor device and method for fabricating the same
摘要 A source region is formed by performing ion implantation plural times to diffuse an impurity from the upper surface of a semiconductor region toward a region far dawn therefrom and to increase impurity concentration in the vicinity of the upper surface of the semiconductor region, whereby the source region and a gate electrode are overlapped with each other surely. Thus, offset between the gate and the source is prevented and an excellent ohmic contact is formed between a source electrode and the source region.
申请公布号 US7372088(B2) 申请公布日期 2008.05.13
申请号 US20040016713 申请日期 2004.12.21
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MIYATA SATOE;MIZOKUCHI SHUJI
分类号 H01L29/76;H01L21/336;H01L29/06;H01L29/08;H01L29/423;H01L29/45;H01L29/78 主分类号 H01L29/76
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