| 摘要 |
FIELD: microelectronics; methods of integrated circuit (IC) stock division to reliable and potentially unreliable circuits. ^ SUBSTANCE: integrated circuits are measured upon noise intensity on outputs of power supply - common point before and after electrostatic discharge is applied with subsequent thermal anneal. Prior to that, IC of the type are measured for intensity correspondence U2 n on outputs "power supply - common point from power voltage in the range of admissible power voltage values, and power voltage value is determined, which corresponds to middle of constant noise intensity value segment. Using this value, noise intensity is measured on representative samples of IC. Dimensionless value is measured: where are the noise values before and after electrostatic discharge is applied and after anneal during 4 hours. If K > 0.2, then IC is considered to be potentially unreliable. ^ EFFECT: invention can be used at manufacturer product testing, and at inspection test of radio equipment manufacturing. ^ 1 dwg |
