| 摘要 |
PROBLEM TO BE SOLVED: To easily build a very small structure for replacing a sample in a thermal analysis apparatus for performing thermal analysis measurement, using a temperature control device that includes a heating device. SOLUTION: This thermal analysis apparatus includes a sample temperature control device 8 that surrounds a sample S, placed on a measurement position Ps and controlling the temperature of the sample; a balance beam 23b that supports the sample S and capable of tilting about a pivot point 22b; and a sample moving device that allows the balance beam 23b to slide in between a first position at which the sample S is situated at the measurement position Ps and a second position at which the sample S is situated at a distant position Pr, which is a position located outside of the sample temperature control unit 8. The distant position Pr is a position which deviates laterally from a line locus L0, extending from the measurement position Ps to the outside of the sample temperature control device 8. When the sample S is at the measurement position Ps, by making the balance beam 23b to linearly slide in the arrow A direction subsequently to with an axial line X0 as center, to thereby carry the sample S to the distant position Pr. COPYRIGHT: (C)2008,JPO&INPIT
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