发明名称 NON-CONFORMAL STRESS LINER FOR ENHANCED MOSFET PERFORMANCE
摘要 <p>A non-conformal stress liner for enhanced MOSFET performance is provided to enhance stress and carrier mobility by reducing or removing an offset spacer and including a non-conformal stress liner. A semiconductor structure includes a semiconductor substrate(12) having at least one FET(Field Effect Transistor) on the semiconductor substrate, at least one reduced offset spacer, and a non-conformal stress liner(30). The non-conformal stress liner is formed to surround a part of the semiconductor substrate and the FET. The non-conformal stress liner is composed of a compressive stress liner. The non-conformal stress liner is a tensile stress liner. In the semiconductor structure, at least one FET is a pFET and an nFET and the non-conformal stress liner surrounding the pFET is a compressive stress liner and the non-conformal stress liner surrounding the pFET is a tensile stress liner.</p>
申请公布号 KR20080040551(A) 申请公布日期 2008.05.08
申请号 KR20070067086 申请日期 2007.07.04
申请人 SAMSUNG ELECTRONICS CO., LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KIM, JUN JUNG;DYER THOMAS;FANG SUNFEI
分类号 H01L29/78 主分类号 H01L29/78
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