发明名称 |
NON-CONFORMAL STRESS LINER FOR ENHANCED MOSFET PERFORMANCE |
摘要 |
<p>A non-conformal stress liner for enhanced MOSFET performance is provided to enhance stress and carrier mobility by reducing or removing an offset spacer and including a non-conformal stress liner. A semiconductor structure includes a semiconductor substrate(12) having at least one FET(Field Effect Transistor) on the semiconductor substrate, at least one reduced offset spacer, and a non-conformal stress liner(30). The non-conformal stress liner is formed to surround a part of the semiconductor substrate and the FET. The non-conformal stress liner is composed of a compressive stress liner. The non-conformal stress liner is a tensile stress liner. In the semiconductor structure, at least one FET is a pFET and an nFET and the non-conformal stress liner surrounding the pFET is a compressive stress liner and the non-conformal stress liner surrounding the pFET is a tensile stress liner.</p> |
申请公布号 |
KR20080040551(A) |
申请公布日期 |
2008.05.08 |
申请号 |
KR20070067086 |
申请日期 |
2007.07.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
KIM, JUN JUNG;DYER THOMAS;FANG SUNFEI |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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