发明名称 PHOTOMASK, MULTIPHASE EXPOSURE METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING INSULATING GATE-TYPE TRANSISTORS
摘要 A photo-mask, a multiphase exposure method and a method of manufacturing a semiconductor device are disclosed. The photo-mask mask includes a first light shielding region which is narrow and elongated, and a second light shielding region which is wider and more elongated than the first light shielding region and is away from the first light shielding region. A phase shifter part and a non-phase shifter part are provided adjacently to both sides of the first light shielding region. Two phase shifter parts or two non-phase shifter parts are respectively provided adjacently to both sides of the second light shielding part.
申请公布号 US2008107974(A1) 申请公布日期 2008.05.08
申请号 US20070862701 申请日期 2007.09.27
申请人 DOUZAKA TOSHIAKI;OGAWA KYOSUKE;HAMA KAORU;SUZUKI HIROAKI 发明人 DOUZAKA TOSHIAKI;OGAWA KYOSUKE;HAMA KAORU;SUZUKI HIROAKI
分类号 G03C5/00;G03F1/30;G03F1/68;G03F1/70;H01L21/027 主分类号 G03C5/00
代理机构 代理人
主权项
地址