发明名称 |
PHOTOMASK, MULTIPHASE EXPOSURE METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING INSULATING GATE-TYPE TRANSISTORS |
摘要 |
A photo-mask, a multiphase exposure method and a method of manufacturing a semiconductor device are disclosed. The photo-mask mask includes a first light shielding region which is narrow and elongated, and a second light shielding region which is wider and more elongated than the first light shielding region and is away from the first light shielding region. A phase shifter part and a non-phase shifter part are provided adjacently to both sides of the first light shielding region. Two phase shifter parts or two non-phase shifter parts are respectively provided adjacently to both sides of the second light shielding part.
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申请公布号 |
US2008107974(A1) |
申请公布日期 |
2008.05.08 |
申请号 |
US20070862701 |
申请日期 |
2007.09.27 |
申请人 |
DOUZAKA TOSHIAKI;OGAWA KYOSUKE;HAMA KAORU;SUZUKI HIROAKI |
发明人 |
DOUZAKA TOSHIAKI;OGAWA KYOSUKE;HAMA KAORU;SUZUKI HIROAKI |
分类号 |
G03C5/00;G03F1/30;G03F1/68;G03F1/70;H01L21/027 |
主分类号 |
G03C5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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